SCOPUS 정보 검색 플랫폼

Volumn 36, Issue 1-3, 2004, Pages 113-121

Functionalization of oxidized silicon surfaces with methyl groups and their characterization

Author keywords

Contact angle; FTIR ATR; Lateral force; Silanes; Silicon dioxide; Silylation; Surface functionalization; Thermal desorption spectroscopy (TDS TPD); Trimethylsilyl termination

Indexed keywords

CHEMICAL BONDS; CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MONOLAYERS; OXIDATION; SILICA; SURFACE PROPERTIES; THERMOANALYSIS; THERMODYNAMIC STABILITY;

FTIR-ATR; HYDROCARBON CHAIN; LATERAL FORCE; SURFACE FUNCTIONALIZATION; THERMAL DESORPTION SPECTROSCOPY (TDS);

SILANES;

EID: 9644303497 PISSN: 07496036 EISSN: None Source Type: Journal
DOI: 10.1016/j.spmi.2004.08.026 Document Type: Article

Times cited : (29)

References (25)

1
- 0345979435
- A. Ulman, Chem. Rev. 96 (1996) 1533.
- (1996) Chem. Rev. , vol.96 , pp. 1533
- Ulman, A.¹

2
- 0034314223
- F. Schreiber, Prog. Surf. Sci. 65 (2000) 151.
- (2000) Prog. Surf. Sci. , vol.65 , pp. 151
- Schreiber, F.¹

3
- 0034831451
- Y. Masuda, T. Sugiyama, H. Lin, W.S. Seo, K. Koumoto, Thin Solid Films 382 (2001) 153.
- (2001) Thin Solid Films , vol.382 , pp. 153
- Masuda, Y.¹ Sugiyama, T.² Lin, H.³ Seo, W.S.⁴ Koumoto, K.⁵

4
- 0003449930
- Harrick Scientific Corp., Ossing, NY
- N. Harrick, Internal Reflection Spectroscopy, 3rd ed., Harrick Scientific Corp., Ossing, NY, 1987.
- (1987) Internal Reflection Spectroscopy, 3rd Ed.
- Harrick, N.¹

5
- 33751156141
- S.S. Cheng, D.A. Scherson, C.N. Sukenik, Langmuir 11 (1995) 1190.
- (1995) Langmuir , vol.11 , pp. 1190
- Cheng, S.S.¹ Scherson, D.A.² Sukenik, C.N.³

6
- 0029274673
- M.R. Linford, P. Fenter, P.M. Eisenberger, C.E.D. Chidsey, J. Am. Chem. Soc. 117 (1995) 3145.
- (1995) J. Am. Chem. Soc. , vol.117 , pp. 3145
- Linford, M.R.¹ Fenter, P.² Eisenberger, P.M.³ Chidsey, C.E.D.⁴

7
- 0032906668
- F. Picard, T. Buffeteau, B. Desbat, M. Auger, M. Pezolet, BioPhys. J. 76 (1999) 539.
- (1999) BioPhys. J. , vol.76 , pp. 539
- Picard, F.¹ Buffeteau, T.² Desbat, B.³ Auger, M.⁴ Pezolet, M.⁵

8
- 0032668614
- T. Valiant, J. Kattner, H. Brunner, U. Mayer, H. Hoffmann, Langmuir 15 (1999) 5339.
- (1999) Langmuir , vol.15 , pp. 5339
- Valiant, T.¹ Kattner, J.² Brunner, H.³ Mayer, U.⁴ Hoffmann, H.⁵

9
- 84986727540
- R. Kaneko, J. Micros. 152 (1988) 363.
- (1988) J. Micros. , vol.152 , pp. 363
- Kaneko, R.¹

10
- 0003624965
- CRC Press, Boca Raton, FL
- B. Bhushan, Handbook of Micro/Nano Tribology, 2nd ed., CRC Press, Boca Raton, FL, 1999.
- (1999) Handbook of Micro/Nano Tribology, 2nd Ed.
- Bhushan, B.¹

11
- 0033558810
- R.W. Carpick, D.F. Ogletree, M. Salmeron, J. Colloid Interface Sci. 211 (1999) 395.
- (1999) J. Colloid Interface Sci. , vol.211 , pp. 395
- Carpick, R.W.¹ Ogletree, D.F.² Salmeron, M.³

12
- 0032606563
- E. Barrena, S. Kopta, D.F. Ogletree, D.H. Charych, M. Salmeron, Phys. Rev. Lett. 82 (1999) 2880.
- (1999) Phys. Rev. Lett. , vol.82 , pp. 2880
- Barrena, E.¹ Kopta, S.² Ogletree, D.F.³ Charych, D.H.⁴ Salmeron, M.⁵

13
- 0025445393
- W. Kern, J. Electrochem. Soc. 137 (1990) 1887.
- (1990) J. Electrochem. Soc. , vol.137 , pp. 1887
- Kern, W.¹

14
- 0026238539
- D.L. Angst, G.W. Simmons, Langmuir 7 (1991) 2236.
- (1991) Langmuir , vol.7 , pp. 2236
- Angst, D.L.¹ Simmons, G.W.²

15
- 0029254175
- R. Banga, J. Yarwood, A.M. Morgan, Langmuir 11 (1995) 618.
- (1995) Langmuir , vol.11 , pp. 618
- Banga, R.¹ Yarwood, J.² Morgan, A.M.³

16
- 33751154555
- R. Banga, J. Yarwood, A.M. Morgan, Langmuir 11 (1995) 4393.
- (1995) Langmuir , vol.11 , pp. 4393
- Banga, R.¹ Yarwood, J.² Morgan, A.M.³

17
- 0035838767
- Y. Liu, L.K. Wolf, M.C. Messmer, Langmuir 17 (2001) 4329.
- (2001) Langmuir , vol.17 , pp. 4329
- Liu, Y.¹ Wolf, L.K.² Messmer, M.C.³

18
- 0037447538
- D.L. Elmore, C.L. Leverette, D.B. Chase, A.T. Kalambur, Y. Liu, J.F. Rabolt, Langmuir 19 (2003) 3519.
- (2003) Langmuir , vol.19 , pp. 3519
- Elmore, D.L.¹ Leverette, C.L.² Chase, D.B.³ Kalambur, A.T.⁴ Liu, Y.⁵ Rabolt, J.F.⁶

19
- 0004187776
- "Infrared spectra" and "mass spectra"
- P.J. Linstrom, W.G. Mallard (Eds.), NIST Chemistry WebBook, March 2003, National Institute of Standards and Technology, Gaithersburg, MD
- S.E. Stein, "Infrared Spectra" and "Mass Spectra", in: P.J. Linstrom, W.G. Mallard (Eds.), NIST Chemistry WebBook, NIST Standard Reference Database Number 69, March 2003, National Institute of Standards and Technology, Gaithersburg, MD, 2003, p. 20899, http://webbook.nist.gov.
- (2003) NIST Standard Reference Database Number 69 , vol.69 , pp. 20899
- Stein, S.E.¹

20
- 0031997947
- X.S. Zhao, G.Q. Lu, J. Phys. Chem. B 102 (1998) 1556.
- (1998) J. Phys. Chem. B , vol.102 , pp. 1556
- Zhao, X.S.¹ Lu, G.Q.²

21
- 0005098720
- S. Haukka, A. Root, J. Phys. Chem. 98 (1994) 1695.
- (1994) J. Phys. Chem. , vol.98 , pp. 1695
- Haukka, S.¹ Root, A.²

22
- 9644260391
- J.V. Urenovitch, A.G. MacDiarmid, E.R. Nixon, Appl. Spectrosc. 19 (1965) 80.
- (1965) Appl. Spectrosc. , vol.19 , pp. 80
- Urenovitch, J.V.¹ MacDiarmid, A.G.² Nixon, E.R.³

23
- 0032098211
- U. Srinivasan, M.R. Houston, R.T. Howe, R. Maboudian, J. Microelectromech. Syst. 7 (1998) 252.
- (1998) J. Microelectromech. Syst. , vol.7 , pp. 252
- Srinivasan, U.¹ Houston, M.R.² Howe, R.T.³ Maboudian, R.⁴

24
- 0031561087
- G.J. Kluth, M.M. Sung, R. Maboudian, Langmuir 13 (1997) 3775.
- (1997) Langmuir , vol.13 , pp. 3775
- Kluth, G.J.¹ Sung, M.M.² Maboudian, R.³

25
- 0011721664
- J.W. Severin, H. van der Wel, I.G.J. Camps, J.M.E. Baken, J.M.J. Vankan, Surf. Int. Anal. 19 (1992) 133.
- (1992) Surf. Int. Anal. , vol.19 , pp. 133
- Severin, J.W.¹ Van Der Wel, H.² Camps, I.G.J.³ Baken, J.M.E.⁴ Vankan, J.M.J.⁵

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