Disilicide diffusion coating inspection by micro X-ray flourescence imaging

Journal of Nondestructive Evaluation

Volumn 23, Issue 3, 2004, Pages 95-105

  Doering, Edward R ^a   Havrilla, George J ^b   Miller, Thomasin C ^b  

^a ROSE HULMAN INSTITUTE OF TECHNOLOGY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Coating; Imaging; X ray fluorescence

Indexed keywords

AIRCRAFT MATERIALS; COMPOSITION; CORROSION PROTECTION; DIFFUSION COATINGS; EMISSION SPECTROSCOPY; HIGH TEMPERATURE EFFECTS; IMAGING TECHNIQUES; NIOBIUM ALLOYS; NONDESTRUCTIVE EXAMINATION; OXIDATION; SURFACE PROPERTIES; X RAY SPECTROSCOPY;

CHROMIUM DISILICIDE COATING; HIGH SPATIAL RESOLUTION MULTISPECTRAL IMAGE; HIGH TEMPERATURE OXIDATION; MICRO X RAY FLUORESCENCE IMAGING; THRUSTER COATING INSPECTION;

CHROMIUM COMPOUNDS;

EID: 9244261070     PISSN: 01959298     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JONE.0000048865.96417.bc     Document Type: Article

References (24)

1. C-103 Data Sheet Literature, Wah Chang Company, 2003, Albany, OR. Available at:http://www.alleghenytechnologies.com.
2. S. Priceman, Private Communication, May 2003, Hitemco, Old Bethpage, New York.
3. K. Ogawa, D. Minkov, T. Shoji, M. Sata, and H. Hashimoto, "NDE of degradation of thermal barrier coating by means of impedance spectroscopy," NDT&E Int. 32, pp. 177-185 (1999).
4. 3+ piezospectrocopy," Appl. Phys. Lett. 69 (24), pp. 3745-3756 (1996).
5. H. P. Crutzen, E. Lakestani, and I. R. Nicholls, "Ultrasonic char- acterization of thermal barrier coatings," Proc. IEEE Ultras. Symp. pp. 731-734 (1996).
6. M. K. Tiwari, A. K. Singh, and K. I. S. Sawhney, "Analysis of stainless steel samples by energy dispersive X-ray fluorescence (EDXRF) spectrometry," Bull. Mater. Sci. 24 (6), pp. 633-638 (2001).
7. P. Wobrauschek, G. Halmetschlager, S. Zamini, C. Jokubonis, G. Trnka, and M. Karwowski, "Energy-dispersive X-ray fluo- rescence analysis of Celtic glasses," X-Ray Spectrom. 29, pp. 25-33 (2000).
8. R. Wilson, G. Hamill, M. Funahashi, M. Kuraoka, S. Fujimura, and H. Kohno, "Comprehensive characterization of thin films using X-ray reflectometry and fluorescence," Materials Research Society Fall Meeting Conference Proceedings, Nov. 30-Dec. 4, Boston, MA (1998).
9. C. G. Worley, G. J. Havrilla, and P. S. Dunn, " Quantification of large scale micro-x-ray fluorescence elemental images," Appl. Spectrosc. 55 (11), pp. 1448-1454 (2001).
10. M. L. Hoppe, D. Harding, and R. B. Stephens, "Characterization of chemical dopants in ICF targets," General Atomics Report GA-A22485 1996, General Atomics, San Diego, CA.
11. G. J. Havrilla, "Applications of X-ray microfluorescence to materials analysis," X-Ray Spectrom. 26 (6), pp. 364-373 (1997).
12. X. Gao, I. Yu. Ponomarev, Q. F. Xiao, W. M. Gibson, and D. A. Carpenter, "Monolithic polycapillary focusing optics and their applications in microbeam X-ray fluorescence," Appl. Phys. Lett. 69 (11), pp. 1529-1531 (1996).
13. C. G. Worley and G. J. Havrilla, "Micro-X-ray fluorescence characterization of mixed oxide fuel surrogate feed material," Anal. Chem. 70 (14), pp. 2957-2963 (1998).
14. J. R. Schoonover, F. Weesner, G. J. Havrilla, M. Sparrow, and P. Treado, "Integration of elemental and molecular imaging to characterize heteogeneous inorganic materials," Appl. Spectrosc. 52 (12), pp. 1505-1514 (1998).
15. J. R. Schoonover and G. J. Havrilla, "Combining X-ray fluores- cence spectrometry and vibrational microscopy to assess highly heterogeneous, actinide-contaminated materials," Appl. Spectrosc. 53 (3), pp. 257-265 (1999).
16. S. Bichlmeier, K. Janssens, J. Heckel, D. Gibson, P. Hoffmann, and H. M. Ortner, "Component selection for a compact micro- XRF spectrometer," X-Ray Spectrom. 30 , pp. 8-14 (2001).
17. E. P. Bertin, Introduction to X-Ray Spectrometric Analysis, p. 351, 1978, Plenum Press, New York, NY.
18. E. P. Bertin, Introduction to X-ray Spectrometric Analysis, p. 45, 1978, Plenum Press, New York, NY.
19. E. P. Bertin, Introduction to X-Ray Spectrometric Analysis, p. 44, 1978, Plenum Press, New York, NY.
20. C. T. Chantler, K. Olsen, R. A. Dragoset, A. R. Kishore, S. A. Kotochigova, and D. S. Zucker, X-Ray Form Factor, Attenuation and Scattering Tables, Version 2.0, National Institute of Standards and Technology, Gaithersburg, MD, 2003. Available at http://physics.nist.gov/ffast.
21. A. C. Thompson and D. Vaughan, editors, X-Ray Data Booklet, 2nd ed. 2001, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA.
22. A. Seaman, Analysis Depth for μ-EDXRF Methods, EDAX Eagle-11 μ-Probe Application Note, EDAX, Inc., Mahwa, NJ, 2000.
23. B. McLemore, Private Communication (May 2003), Spin Forge, El Segundo, CA.
24. P. Thevenaz, "Turbo Registration" plug-in for ImageJ software, 2003, Swiss Federal Institute of Technology, Lausanne, Switzerland. Available at: http://bigwww.epfl.ch/thevenaz/turboreg.