Applications of X-Ray Microfluorescence to Materials Analysis

X-Ray Spectrometry

Volumn 26, Issue 6, 1997, Pages 364-373

  Havrilla, George J ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE;

CUSTOMER-SERVICE; ELEMENTAL MAPS; LINE: PROFILES; MATERIAL-BASED; MATERIALS ANALYSIS; NON DESTRUCTIVE; QUALITATIVE ANALYSIS; SPATIALLY RESOLVED; SPECTRUM LINE; X-RAY MICROFLUORESCENCE;

CERAMIC MATERIALS;

EID: 0031500764     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199711/12)26:6<364::AID-XRS235>3.0.CO;2-W     Document Type: Article

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