Integration of elemental and molecular imaging to characterize heterogeneous inorganic materials

Applied Spectroscopy

Volumn 52, Issue 12, 1998, Pages 1505-1514

  Schoonover, Jon R ^a   Weesner, Forrest ^a,d   Havrilla, George J ^a   Sparrow, Mark ^b   Treado, Patrick ^c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF PITTSBURGH   (United States)

^c ChemIcon Inc   (United States)

^d Neptune and Company Inc   (United States)

Author keywords

Chemical imaging; Integrated spectroscopy; LCTF; Materials; Micro infrared; Micro Raman; Micro X ray fluorescence; Microscopy

Indexed keywords

EID: 0001208062     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702981943202     Document Type: Article

References (22)

1. P. Colarusso, L. H. Kidder, I. W. Levin, J. C. Fraser, J. F. Arens, and E. N. Lewis, Appl. Spectrosc. 52, 106A (1998).
2. Microscopic and Spectroscopic Imaging of the Chemical State, M. D. Morris, Ed. (Marcel Dekker, New York, 1993).
3. H. R. Morris, C. C. Hoyt, P. Miller, and P. J. Treado, Appl. Spectrosc. 50, 805 (1996).
4. B. J. Cross, R. D. Lamb, S. Ma, and J. M. Paque, in Advances in X-ray Analysis (Plenum Press, New York, 1992), Vol. 35, p. 1255.
5. B. Vekemans, K. Janssens, L. Vincze, A. Aerts, F. Adams and J. Hertogen, X-ray Spectrom. 26, 333 (1997).
6. G. J. Havrilla, X-ray Spectrom. 26, 364 (1997).
7. H. R. Morris, C. C. Hoyt, and P. J. Treado, Appl. Spectrosc. 48, 857 (1994).
8. E. N. Lewis and I. W. Levin, Appl. Spectrosc. 49, 672 (1995).
9. L. H. Kidder, I. W. Levin, E. N. Lewis, V. D. Kleinman, and E. J. Heilweil, Opt. Lett. 22, 742 (1997).
10. P. J. Treado and M. D. Morris, Appl. Spectrosc. Rev. 29, 1 (1994).
11. B. J. Cross and J. E. Augenstine. in Advances in X-ray Analysis (Plenum Press, New York, 1991), Vol. 34, p. 57.
12. D. C. Wherry, B. J. Cross, and T. H. Briggs, in Advances in X-ray Analysis, (Plenum Press, New York, 1988), Vol. 31, p. 93.
13. R. G. Messerschmidt and M. A. Harthcock, Infrared Microspectroscopy: Theory and Applications, Practical Spectroscopy Series, Vol. 6 (Marcel Dekker, New York, 1988).
14. R. Barbillat, P. Dhamelincourt, M. Delhaye, and E. DaSilva, J. Raman Spectrosc. 25, 3 (1994).
15. M. Bowden, D. J. Gardiner, G. Rice, and D. L. Gerrard, J. Raman Spectrosc. 21, 37 (1990).
16. H. R. Morris, C. C. Hoyt, P. Miller, and P. J. Treado, Appl. Spectrosc. 50, 805 (1996).
17. J. F. Turner II and P. J. Treado, Proc. SPIE-Int. Soc. Opt. Eng. 3061, 280 (1997).
18. H. R. Morris, B. Munro, R. A. Ryntz, and P. J. Treado, Langmuir 14, 2426 (1998).
19. G. M. Begun, R. G. Haire, W. R. Wilmarth, and J. R. Peterson, J. Less-Common Met. 162, 129 (1990).
20. V. G. Keramidas and W. B. White, J. Chem. Phys. 59, 1561 (1973).
21. P. J. Treado, A. Govil, M. D. Morris, K. D. Sternitzke, and R. L. McCreery, Appl. Spectrosc. 44, 1270 (1990).
22. R. G. Behrens, E. C. Buck, N. L. Dietz, J. K. Bates, E. Van Deventer, and D. J. Chaiko, Argonne National Laboratory Report ANL-95/35 (1995).