Characterization of quench-condensed cesium on a nanometer scale at low temperatures

Journal of Low Temperature Physics

Volumn 137, Issue 3-4, 2004, Pages 179-188

  Zech, M ^a   Fubel, A ^a   Leiderer, P ^a   Klier, J ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CONDENSATION; EVAPORATION; HELIUM; IMAGE ANALYSIS; LOW TEMPERATURE EFFECTS; NANOSTRUCTURED MATERIALS; QUENCHING; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE ROUGHNESS;

CESIUM EVAPORATION; NANOMETER SCALE; SUBSTRATE SURFACE;

CESIUM;

EID: 9244255818     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JOLT.0000049052.35672.56     Document Type: Article

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