A simple, ultrahigh vacuum compatible scanning tunneling microscope for use at variable temperatures

Review of Scientific Instruments

Volumn 67, Issue 7, 1996, Pages 2557-2559

  Mugele, F ^a   Kloos, Ch ^a   Leiderer, P ^a   Moller R ^b  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005451923     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147213     Document Type: Article

References (11)

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2. I. B. Altfeder and A. P. Volodin, Rev. Sci. Instrum. 64, 3157 (1993).
3. Ch. Renner, Ph. Niedermann, A. D. Kent, and O. Fischer, Rev. Sci. Instrum. 61, 965 (1990).
4. B. L. Blackford, M. H. Jericho, and M. G. Boudreau, Rev. Sci. Instrum. 63, 2206 (1992).
5. S. Kleindiek and K. H. Hermann, Rev. Sci. Instrum. 64, 692 (1993).
6. C. A. Lang, M. M. Dovek, and C. F. Quate, Rev. Sci. Instrum. 60, 3109 (1989).
7. R. Gaisch, J. K. Gimzewski, B. Reihl, R. R. Schlittler, M. Tschudy, and W. D. Schneider, Ultramicroscopy 42, 1621 (1992).
8. D. W. Pohl, Rev. Sci. Instrum. 58, 54 (1987).
9. We use Torr Seal from Varian Vacuum Products, a nonconducting two component epoxy resin, which has the disadvantage of becoming conductive after sometime when too high voltages are applied like, for example, between two piezoelectrodes.
10. norm is obviously not suitable.
11. We used PIK 155 material from PI Ceramic, Gera, Germany.