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Volumn 88, Issue 5, 2002, Pages 557021-557024
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Triple-point wetting on rough substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
ELASTIC MODULI;
FREE ENERGY;
POISSON RATIO;
SURFACE ROUGHNESS;
THERMODYNAMICS;
WETTING;
VAN DER WAALS FORCES;
VAN DER WAALS FILMS;
INTERFACES (MATERIALS);
SUBSTRATES;
ENERGY PENALTIES;
MOLECULAR HYDROGEN;
QUANTITATIVE AGREEMENT;
ROUGH SUBSTRATES;
SMOOTH SUBSTRATES;
SUBSTRATE ROUGHNESS;
TRIPLE-POINT WETTING;
VAN DER WAALS FILMS;
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EID: 0037017190
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.88.055702 Document Type: Article |
Times cited : (31)
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References (31)
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