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Volumn 808, Issue , 2004, Pages 85-96
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Influence of the distribution of tail states in a-Si:H on the field dependence of carrier drift mobilities
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER MOBILITY;
CRYSTAL STRUCTURE;
ELECTRON TRAPS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MATHEMATICAL MODELS;
PHOTOCONDUCTIVITY;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
X RAY DIFFRACTION;
BAND TAILS;
DENSITY OF STATES (DOS);
GAUSSIAN DENSITY;
POWER LAWS;
AMORPHOUS SILICON;
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EID: 12744267780
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-808-a5.6 Document Type: Conference Paper |
Times cited : (4)
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References (21)
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