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Volumn 808, Issue , 2004, Pages 85-96

Influence of the distribution of tail states in a-Si:H on the field dependence of carrier drift mobilities

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CRYSTAL STRUCTURE; ELECTRON TRAPS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; PHOTOCONDUCTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; X RAY DIFFRACTION;

EID: 12744267780     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-808-a5.6     Document Type: Conference Paper
Times cited : (4)

References (21)
  • 10
  • 18
    • 12744250113 scopus 로고    scopus 로고
    • Ph.D. thesis Eindhoven University of Technology
    • A. H. M. Smets, Ph.D. thesis (Eindhoven University of Technology, 2002).
    • (2002)
    • Smets, A.H.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.