Hole Drift-Mobility Measurements in Contemporary Amorphous Silicon

Materials Research Society Symposium - Proceedings

Volumn 762, Issue , 2003, Pages 345-350

  Dinca, S ^a   Ganguly, G ^b   Lu, Z ^c   Schiff, E A ^a   Vlahos, V ^c   Wronski, C R ^c   Yuan, Q ^a,d  

^a SYRACUSE UNIVERSITY   (United States)

^b BP Solar Inc ^*  (United States)

^c The Pennsylvania State University   (United States)

^d dpiX Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; BAND STRUCTURE; CRYSTALLINE MATERIALS; DEPOSITION; ELECTRIC FIELD EFFECTS; ELECTRON MOBILITY; ELECTRON TRAPS; ETCHING; HOLE MOBILITY; HYDROGENATION; PHOTOCURRENTS; SCHOTTKY BARRIER DIODES;

DRIFT MOBILITIES; VALENCE BANDS;

AMORPHOUS SILICON;

EID: 1642561592     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-762-a7.1     Document Type: Conference Paper

References (7)

1. Qi Wang, H. Antoniadis, E. A. Schiff, and S. Guha, Phys. Rev. B, 47, 9435 (1993).
2. Q. Gu, Q. Wang, E. A. Schiff, Y.-M. Li, and C. T. Malone, J. Appl. Phys. 76, 2310 (1994).
3. G. Ganguly and A. Matsuda, J. Non-Cryst. Solids 198-200, 1003 (1996); Ganguly's hole drift-mobility measurements are consistent with later measurements on the same materials by P. Rao at Syracuse University (private communication).
4. 1-1/α [1]. The authors gave a room-temperature dispersion parameter of 0.7; for other temperatures, we assumed the dispersion parameter to be proportional to the absolute temperature, as expected for bandtail multiple-trapping.
5. 0 = kT/(1-α) that obtains from the assumption that the valence band edge lies within the exponential bandtail (E. A. Schiff, Solar Energy Materials and Solar Cells, in press (2003).
6. 0 = kT/(1-α) that obtains from the assumption that the valence band edge lies within the exponential bandtail (E. A. Schiff, Solar Energy Materials and Solar Cells, in press (2003).
7. Q. Gu, E. A. Schiff, J.-B. Chevrier, and B. Equer, in Amorphous Silicon Technology - 1993, edited by E. A. Schiff, et al (Materials Research Society, Symposium Proceedings Vol. 297, Pittsburgh, 1993), pp. 425-430.