Distributional and inferential properties of the process loss indices

Journal of Applied Statistics

Volumn 31, Issue 9, 2004, Pages 1115-1135

  Pearn, W L ^a   Chang, Y C ^b   Wu, Chien Wei ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b CHING YUN UNIVERSITY   (Taiwan)

^c FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

MLE; Potential relative expected loss; Relative expected loss; Relative mean squared error; Relative off target squared; UMVUE

Indexed keywords

EID: 9144266575     PISSN: 02664763     EISSN: None     Source Type: Journal    
DOI: 10.1080/0266476042000280364     Document Type: Article

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