Interpretation of process capability indices and some alternatives

Quality Engineering

Volumn 9, Issue 4, 1997, Pages 587-596

  Tsui, Kowk Leung ^a,b  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b Georgia Institute of Technology   (United States)

Author keywords

Expected relative loss; Potential expected relative loss; Potential quality yield; Potential yield; Quality yield; Yield

Indexed keywords

EID: 0006294011     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1080/08982119708919080     Document Type: Article

References (15)

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