SCOPUS 정보 검색 플랫폼

Surface Science Spectra

Volumn 9, Issue 1, 2002, Pages 54-61

Analysis of Nanocrystalline ZnS Thin Films by XPS

(5) Barreca, Davide a Gasparotto, Alberto b Maragno, Cinzia b Tondello, Eugenio b Spalding, Trevor R c

a CNR Consiglio Nazionale delle Ricerche (Italy)

b UNIVERSITY OF PADOVA (Italy)

c UNIVERSITY COLLEGE CORK (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; AUGERS; CHEMICAL VAPOR DEPOSITION; II-VI SEMICONDUCTORS; NANOCRYSTALS; SECONDARY ION MASS SPECTROMETRY; SILICA; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION; ZINC SULFIDE;

CHEMICAL VAPOUR DEPOSITION; GLANCING-INCIDENCE X-RAY DIFFRACTION; N2 ATMOSPHERES; NANOCRYSTALLINES; PRECURSOR COMPOUNDS; SILICA SUBSTRATE; SINGLE-SOURCE PRECURSOR; SPECTRA'S; SYNTHESISED; ZNS THIN FILMS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 85116900356 PISSN: 10555269 EISSN: 15208575 Source Type: Journal
DOI: 10.1116/11.20030117 Document Type: Article

Times cited : (62)

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