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Volumn , Issue , 1999, Pages

A resonating comb/ring angular rate sensor vacuum packaged via wafer bonding

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MICROMECHANICS; ELECTRONICS PACKAGING; SILICON WAFERS;

EID: 85072409923     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/1999-01-1043     Document Type: Conference Paper
Times cited : (5)

References (16)
  • 4
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    • A CMOS Integrated Surface Micromachined Angular Rate Sensor: It's Automotive Applications
    • 3B1.04, (IEEE)
    • Sparks D., Zarabadi S., Johnson J., Jiang Q., Chia M., Larsen O., Higdon W., "A CMOS Integrated Surface Micromachined Angular Rate Sensor: It's Automotive Applications," Transducers'97, 3B1.04, (IEEE 1997) p. 851
    • (1997) Transducers'97 , pp. 851
    • Sparks, D.1    Zarabadi, S.2    Johnson, J.3    Jiang, Q.4    Chia, M.5    Larsen, O.6    Higdon, W.7
  • 6
    • 0029244427 scopus 로고
    • Buying Micromachined Sensors in Large Volumes
    • Sparks D., and Brown R., "Buying Micromachined Sensors in Large Volumes," Sensors, Vol. 12, No. 2, (1995), p. 53.
    • (1995) Sensors , vol.12 , Issue.2 , pp. 53
    • Sparks, D.1    Brown, R.2
  • 7
  • 9
    • 0015198658 scopus 로고    scopus 로고
    • Plastic Deformation in Central Regions of Epitaxial Silicon Slices
    • Dyer L., Huff H., and Boyd W., "Plastic Deformation in Central Regions of Epitaxial Silicon Slices," J.Appl.Physics, vol. 42, 1071, pp. 5680-5688.
    • J.Appl.Physics , vol.42 , Issue.1071 , pp. 5680-5688
    • Dyer, L.1    Huff, H.2    Boyd, W.3
  • 10
    • 0023314169 scopus 로고
    • Dislocation and stacking fault interactions in silicon
    • Sparks D., "Dislocation and Stacking Fault Interactions in Silicon," J.Electronic Materials, vol. 16, 1987, pp. 119-122. (Pubitemid 17550276)
    • (1987) Journal of Electronic Materials , vol.16 , Issue.2 , pp. 119-122
    • Sparks Douglas, R.1
  • 12
    • 84877370482 scopus 로고    scopus 로고
    • Fatigue Crack Initiation and Growth Testing of MEMS and Small Structures
    • Aug
    • Muhlstein C., "Fatigue Crack Initiation and Growth Testing of MEMS and Small Structures," in JPL MEMS Reliability and Qualification Workshop, Aug. 1997, pp. 98-121.
    • (1997) JPL MEMS Reliability and Qualification Workshop , pp. 98-121
    • Muhlstein, C.1
  • 13
    • 0030182153 scopus 로고    scopus 로고
    • Flexible Vacuum Packaging Method for Resonating Micromachines
    • Sparks D., Jordan L., and Frazee J., "Flexible Vacuum Packaging Method for Resonating Micromachines," Sensors and Actuators A, Vol. 55, (1996), p. 179.
    • (1996) Sensors and Actuators A , vol.55 , pp. 179
    • Sparks, D.1    Jordan, L.2    Frazee, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.