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Volumn 3, Issue , 2016, Pages 131-136

ESTIMATING CORN YIELD in the United States with MODIS EVI and MACHINE LEARNING METHODS

Author keywords

Artificial Neural Network; Corn Yield; Deep Learning; MODIS EVI; Support Vector Machine; Wavelet Transform

Indexed keywords


EID: 85048923897     PISSN: 21949042     EISSN: 21949050     Source Type: Conference Proceeding    
DOI: 10.5194/isprs-annals-III-8-131-2016     Document Type: Conference Paper
Times cited : (58)

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