Nanofriction Behavior of Cluster-Assembled Carbon Films

Journal of Nanoscience and Nanotechnology

Volumn 2, Issue 6, 2002, Pages 637-643

  Podesta A ^a   Fantoni, G ^a   Milani, P ^a   Ragazzi, M ^b   Donadio, D ^b   Colombo, L ^c  

^a UNIVERSITY OF MILAN   (Italy)

^b UNIVERSITY OF MILANO BICOCCA   (Italy)

^c UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

AFM; Carbon; Cluster Assembled materials; Friction; Nanotribology

Indexed keywords

CARBON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; COMPARATIVE STUDY; COMPUTER SIMULATION; CRYSTALLIZATION; EVALUATION; FRICTION; LUBRICATION; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; MICROMANIPULATION; NANOTECHNOLOGY; SURFACE PROPERTY; VALIDATION STUDY;

CARBON; COMPUTER SIMULATION; CRYSTALLIZATION; FRICTION; LUBRICATION; MATERIALS TESTING; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; MODELS, MOLECULAR; NANOTECHNOLOGY; STRESS, MECHANICAL; SURFACE PROPERTIES;

EID: 85047673313     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2002.149     Document Type: Article

References (36)

1. B. Bhushan, Handbook of Micro and Nano Tribology, Chemical Rubber, Boca Raton, FL (1995).
2. R. Carpick and M. Salmeron, Chem. Rev. 97, 1163 (1997).
3. Mater. Res. Soc. Bull. 26 (2001).
4. J. Sullivan, T. Freidmann, and K. Hjort, Mater. Res. Soc. Bull. 26, 309 (2001).
5. S. Sundararajan and B. Bhushan, Wear 225/229, 678 (1999).
6. P. Milani, P. Piseri, E. Barborini, A. Podestà, and C. Lenardi, J. Vac. Sci. Technol. A 19, 2025 (2001).
7. D. Donadio, L. Colombo, P. Milani, and G. Benedek, Phys. Rev. Lett. 83, 776 (1999).
8. E. Barborini, P. Piseri, A. Li Bassi, A. Ferrari, C. Bottani, and P. Milani, Chem. Phys. Lett. 300, 633 (1999).
9. C. Casari, A. Li Bassi, C. Bottani, E. Barborini, P. Piseri, A. Podestà, and P. Milani, Phys. Rev. B 64, 085417/1 (2001).
10. G. Dedkov, Phys. Status Solidi A 179, 3 (2000).
11. G. Adams and M. Nosonovsky, J. Trib. 33, 431 (2000).
12. V. Koinkar and B. Bhushan, J. Appl. Phys. 81, 2472 (1997).
13. S. Sundararajan and B. Bushan, J. Appl. Phys. 88, 4825 (2000).
14. F. Bowden and D. Tabor, The Friction and Lubrication of Solids, Clarendon, Oxford (1950).
15. P. Milani and S. Iannotta, Cluster Beam Synthesis of Nanostructured Materials, Springer-Verlag, Berlin (1999).
16. E. Barborini, P. Piseri, and P. Milani, J. Phys. D 32, L105 (1999).
17. P. Piseri, A. Podestà, E. Barborini, and P. Milani, Rev. Sci. Instrum. 72, 2261 (2001).
18. J. Tersoff, Phys. Rev. B 37, 6991 (1988).
19. J. Tersoff, Phys. Rev. Lett. 61, 2879 (1988).
20. W. Cheong and L. Zhang, Nanotechnology 11, 173 (2000).
21. C. Mate, G. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. 59, 1942 (1987).
22. K. Johnson, K. Kendall, and A. Roberts, Proc. Roy. Soc. London Ser. A 324, 301 (1971).
23. A. Podesta, Ph.D. Thesis, Università degli Studi di Milano (2002).
24. A. Podesta, G. Fantoni, P. Milani, C. Guida, and S. Volponi, Thin Solid Films, 419, 154 (2002).
25. One should keep in mind that we have measured the friction coefficient and adhesive offset of the pair (ns-carbon, silicon AFM tip). Using AFM tips with different compositions can lead in principle to different friction coefficients and adhesive offsets.
26. V. Koinkar and B. Bhushan, J. Vac. Sci. Technol. A 14, 2378 (1996).
27. C. Gibson, G. Watson, and S. Myhra, Nanotechnology 7, 259 (1996).
28. The statistical error in each measurement is in general very small, because with our procedure we may acquire up to 512 × 512 friction-load pairs in each image and many images fast and reliably.
29. A. Grill, Surf. Coat. Technol. 94/95, 507 (1997).
30. M. Binggeli and C. Mate, Appl. Phys. Lett. 65, 415 (1994).
31. B. Bhushan and C. Dandavate, J. Appl. Phys. 87, 1201 (2000).
32. L. Ostrovskaya, A. Podestà, P. Milani, V. Ralchenko, Influence of Surface Morphology on the Wettability of Cluster-Assembled Carbon Films, (submitted).
33. C. B. R. Buzio, E. Gnecco, and U. Valbusa, Carbon 40, 883 (2002).
34. U. Schwarz, O. Zworner, P. Koster, and R. Wiesendanger, Phys. Rev. B 56, 6987 (1997).
35. E. Gnecco, R. Buzio, C. Boragno, and U. Valbusa, Acta Phys. Slovaca 50, 423 (2000).
36. C. Putman and M. Igarashi, Appl. Phys. Lett. 66 (1995).