Semi-supervised face detection

IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops

Volumn 2005-September, Issue , 2005, Pages

  Sebe, Nicu ^a   Cohen, Ira ^b   Huang, Thomas S ^c   Gevers, Theo ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b HP Research Labs   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAYESIAN NETWORKS; CLASSIFICATION (OF INFORMATION); COMPUTER VISION; SEMI-SUPERVISED LEARNING;

BAYESIAN NETWORK CLASSIFIERS; CLASSIFIER'S PERFORMANCE; LABELED TRAINING DATA; PERFORMANCE DEGRADATION; PROBABILISTIC MIXTURE MODELS; SEMI-SUPERVISED; UNLABELED DATA;

FACE RECOGNITION;

EID: 85040145691     PISSN: 21607508     EISSN: 21607516     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2005.523     Document Type: Conference Paper

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