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Journal of Materials Science: Materials in Electronics

Volumn 22, Issue 2, 2011, Pages 111-115

Electrical and crystallographic properties of nanocrystalline CdSe 0.5S0.5 composite thin films deposited by dip method

(3) Chate, P A a Sathe, D J b Hankare, P P c

a JSM College (India)

b KIT's College of Engineering (India)

c SHIVAJI UNIVERSITY (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE FILMS; DEPOSITION; GRAIN BOUNDARIES; NANOCRYSTALS; TEMPERATURE; TEMPERATURE DISTRIBUTION; X RAY DIFFRACTION;

COMPOSITE THIN FILMS; CRYSTALLOGRAPHIC PROPERTIES; ELECTRICAL CONDUCTIVITY; LOW-TEMPERATURE CONDUCTIVITY; SODIUM SELENOSULPHATE; SPECIFIC CONDUCTIVITY; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION STUDIES;

THIN FILMS;

EID: 85027944112 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-010-0096-9 Document Type: Article

Times cited : (12)

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