Electron Microscopy Techniques for Imaging and Analysis of Nanoparticles

Developments in Surface Contamination and Cleaning: Second Edition

Volumn 1, Issue , 2008, Pages 395-443

  Wang, Zhong Lin ^a   Lee, Jean L ^b  

^a Georgia Institute of Technology   (United States)

^b Nano SciTech   (United States)

Author keywords

Backscattered electron; Characterization; EDS; EELS; Electron gun; Lens; Microanalysis; Nanodiffraction; Nanoparticles; Nanoscale; Secondary electron; SEM; STEM; TEM

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON GUNS; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LENSES; MICROANALYSIS; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; STEM (SCIENCE, TECHNOLOGY, ENGINEERING AND MATHEMATICS); TRANSMISSION ELECTRON MICROSCOPY;

BACKSCATTERED ELECTRONS; ELECTRON ENERGY FILTERING; INDIVIDUAL NANOPARTICLES; MECHANICAL AND ELECTRICAL PROPERTIES; NANO SCALE; NANODIFFRACTION; SECONDARY ELECTRONS; STRUCTURE PROPERTY RELATIONSHIPS;

CHEMICAL ANALYSIS;

EID: 85014495885     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-323-29960-2.00009-5     Document Type: Chapter

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