A solution-phase chemical approach to a new crystal structure of cobalt

Angewandte Chemie - International Edition

Volumn 38, Issue 12, 1999, Pages 1788-1791

  Dinega, Dmitry P ^a   Bawendi, M G ^a  

^a Massachusetts Institute of Technology   (United States)

Author keywords

Clusters; Cobalt; Structure elucidation; X ray scattering

Indexed keywords

COBALT; LIGAND; OXIDE;

ARTICLE; CHEMICAL REACTION KINETICS; CHEMICAL STRUCTURE; CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLIZATION; MOLECULAR MODEL; STRUCTURE ANALYSIS; THERMODYNAMICS; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

EID: 0033553823     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3773(19990614)38:12<1788::AID-ANIE1788>3.0.CO;2-2     Document Type: Article

References (13)

1. Powder diffraction file PDF-2 database sets 1-44, 1994.
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8. Powder diffraction patterns were recorded on a Rigaku Rotaflex 250 mm radius diffractometer with Cu-anode radiation. Measurements were in reflection mode at 19°C with a step size of 0.002°. The pattern was calibrated with an internal Si standard (640A, NIST, USA).
9. C. B. Shoemaker, D. P. Shoemaker, T. E. Hopkins, S. Yidepit, Acta Crystallogr. Sect. B 1978, 34, 3573-3576.
10. The calculation was performed as follows: A stick spectrum was first calculated by using the atomic coordinates presented in Table 1 applying standard diffraction theory. Lorentzian line shapes with a width calculated from the size of the crystals using the Debye-Scherrer equation were then added. Small differences in line shape between theory and experiment are the result of the size distribution in the sample.
11. Landolt-Börnstein numerical data and functional relationships in Science and technology, Vol. 19/a (Eds.: K. H. Hellwege, O. Madelung), Springer, Berlin, 1986, p. 36.
12. The small amount of cobalt oxide (CoO) observed in Figure 2c was formed during the heating process. The observed sharpening of the peaks is due to sintering and annealing of the crystal.
13. S. Sun, C. B. Murray, J. Appl. Phys. 1999, 85, 4325-4330.