Development of a compact system for in-situ X-ray scattering studies of organic thin film deposition

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 1150-1153

  Headrick, R L ^a   Malliaras, G G ^b   Mayer, A C ^b   Deyhim, A K ^c   Hunt, A C ^c  

^a University of Vermont   (United States)

^b School of Chemical and Molecular Engineering   (United States)

^c Advanced Design Consulting USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012279050     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1758003     Document Type: Conference Paper

References (13)

1. P. Zschack, J.B. Cohen, Y.W. Chung, J. Appl. Cryst. 21, 466 (1989).
2. I.K. Robinson, W.K. Waskiewicz, P.M. Fuoss, J.B. Stark and P.A. Bennet, Phys. Rev. B 33, 7013 (1986).
3. G.A. Held, J.L. Jordan-Sweet, P.M. Horn, A. Mak, R.J. Birgeneau, Phys. Rev. Lett. 59, 2075 (1987).
4. J.W. Chung, K. Evans-Lutterodt, E.D. Specht, R.J. Birgeneau, P.J. Estrup and A.R. Kortan, Phys. Rev. Lett. 59, 2192 (1987).
5. J.R. Dennison, S.K. Wang, P. Dai, T. Angot, H. Taub, S.N. Erlich, Rev. Sci. Instrum. 63 (8), 3835 (1992).
6. A.P. Clemens, S. Brennan, Rev. Sci. Instrum. 63 (1), 1147 (1992).
7. H. You, R.P. Chiarello, H.K. Kirn and K.G. Vandervoort, Phys. Rev. Lett. 70, 2900 (1993).
8. P. Fenter, P. Eisenberger, P. Burrows, S.R. Forrest, and K.S. Liang, Physica B 221, 145 (1996).
9. K.A. Ritley, B. Krause, F. Schreiber and H. Dosch, Rev. Sci. Instrum. 72 (2), 1453 (2001).
10. H.E. Katz, and Z. Bao, J. Phys. Chem. 104, 671 (2000).
11. D.J. Grundlach, Y.Y. Lin, T.N. Jackson, S.F. Nelson andD.G. Schlom, IEEE Electron. Device. Lett. 18, 87 (1997).
12. F. Gamier, Ace. Chem. Res. 32, 209 (1999).
13. C.D. Dimitrakopoulos, A.R. Brown and A. Pomp, J. Appl. Phys. 80, 2501 (1996).