Local microstructure and stress in Al(Cu) thin film structures studied by x-ray microdiffraction

Materials Research Society Symposium - Proceedings

Volumn 673, Issue , 2001, Pages P7.7.1-P7.7.6

  Valek, B C ^a   Tamura, N ^a   Spolenak, R ^a   MacDowell, A A ^a   Celestre, R S ^a   Padmore, H A ^a   Bravman, J C ^a   Brown, W L ^a   Batterman, B W ^a   Patel, J R ^a  

^a STANFORD UNIVERSITY   (United States)

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EID: 85010715794     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)