Deep saliency with encoded low level distance map and high level features

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 2016-December, Issue , 2016, Pages 660-668

  Lee, Gayoung ^a   Tai, Yu Wing ^b   Kim, Junmo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b SENSETIME RESEARCH   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; CONVOLUTION; NEURAL NETWORKS; PALMPRINT RECOGNITION; PATTERN RECOGNITION;

CONVOLUTIONAL NEURAL NETWORK; DEEP LEARNING; FULLY CONNECTED NEURAL NETWORK; HIGH-LEVEL FEATURES; LOW-LEVEL FEATURES; SALIENCY DETECTION; SALIENT REGIONS; STATE OF THE ART;

FEATURE EXTRACTION;

EID: 85009885131     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2016.78     Document Type: Conference Paper

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