|
Volumn 640, Issue , 2001, Pages H2.7.1-H2.7.6
|
Structural characterization of SiC epitaxial layers grown on porous SiC substrates
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 85009851654
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (4)
|
References (9)
|