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Volumn 640, Issue , 2001, Pages H2.7.1-H2.7.6

Structural characterization of SiC epitaxial layers grown on porous SiC substrates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 85009851654     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (9)
  • 7
    • 0031648293 scopus 로고    scopus 로고
    • Study of hollow-core screw dislocations in 6H-SiC and 4H-SiC single crystals
    • in Silicon Carbide, III-Nitrides, and Related Materials 1997, G. Pensl, H. Morkoc, B. Monemar, and E. Janzen (Eds.); Switzerland: Trans Tech Publications, Switzerland; M. Dudley
    • (1998) Materials Science Forum , vol.264-268 , pp. 429-432
    • Si, W.1    Dudley, M.2    Glass, R.3    Tsvetkov, V.4    Carter, C.H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.