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Volumn 24, Issue 6, 2009, Pages 1570-1576

Investigation on IGBT High-Frequency Plasma Extraction Transient Time Oscillation

Author keywords

Device simulation; IGBT; negative resistance; turn OFF oscillation

Indexed keywords


EID: 85008054209     PISSN: 08858993     EISSN: 19410107     Source Type: Journal    
DOI: 10.1109/TPEL.2009.2015142     Document Type: Article
Times cited : (23)

References (7)
  • 1
    • 0032715962 scopus 로고    scopus 로고
    • Oscillation effects in IGBT's related to negative capacitance phenomena
    • Jan.
    • I. Omura, W. Fichtner, and H. Ohashi, “Oscillation effects in IGBT's related to negative capacitance phenomena,” IEEE Trans. Electron. Devices, vol. 46, no. 1, pp. 237–244, Jan. 1999.
    • (1999) IEEE Trans. Electron. Devices , vol.46 , Issue.1 , pp. 237-244
    • Omura, I.1    Fichtner, W.2    Ohashi, H.3
  • 2
    • 0036132246 scopus 로고    scopus 로고
    • Plasma extraction transit time oscillations in bipolar power devices
    • Jan.
    • B. Gutsmann, P. Mourick, and D. Silber, “Plasma extraction transit time oscillations in bipolar power devices,” Solid State Electron., vol. 46, no. 1, pp. 133–138, Jan. 2002.
    • (2002) Solid State Electron , vol.46 , Issue.1 , pp. 133-138
    • Gutsmann, B.1    Mourick, P.2    Silber, D.3
  • 3
    • 31744441953 scopus 로고    scopus 로고
    • The plasma extraction transit-time oscillation in bipolar power devices–mechanism
    • Feb.
    • R. Siemienic, P. Mourick, M. Netzel, and J. Lutz, “The plasma extraction transit-time oscillation in bipolar power devices–mechanism,” IEEE Trans. Electron. Devices, vol. 53, no. 2, pp. 369–379, Feb. 2006.
    • (2006) IEEE Trans. Electron. Devices , vol.53 , Issue.2 , pp. 369-379
    • Siemienic, R.1    Mourick, P.2    Netzel, M.3    Lutz, J.4
  • 5
    • 85008038047 scopus 로고    scopus 로고
    • The optimum design technology for turn-off oscillation avoidance
    • Europe
    • S. Kitamura, T. Yamaguchi, H. Kondo, Y. Yamaguchi, and M. Honsberg, “The optimum design technology for turn-off oscillation avoidance,” in Proc. PCIM 2007, Europe, p. 45.
    • (2007) Proc. PCIM , pp. 45
    • Kitamura, S.1    Yamaguchi, T.2    Kondo, H.3    Yamaguchi, Y.4    Honsberg, M.5
  • 7
    • 85008027727 scopus 로고    scopus 로고
    • Analysis of plasma extraction transit time oscillations in bipolar power devices
    • R. Smieminic, J. Lutz, M. Netzel, and P. Mourick, “Analysis of plasma extraction transit time oscillations in bipolar power devices,” in Proc. ISPED, Kitakyushu, 2004, pp. 249–252.
    • (2004) Proc. ISPED, Kitakyushu , pp. 249-252
    • Smieminic, R.1    Lutz, J.2    Netzel, M.3    Mourick, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.