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Volumn 8, Issue 5, 2001, Pages 753-759

A New Method for Space Charge Measurements in Dielectric Films for Power Capacitors

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EID: 85008034396     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.959694     Document Type: Article
Times cited : (16)

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