A Digital 1.6 pJ/bit Chip Identification Circuit Using Process Variations

IEEE Journal of Solid-State Circuits

Volumn 43, Issue 1, 2008, Pages 69-77

  Su, Ying ^a   Holleman, Jeremy ^a   Otis, Brian P ^a  

^a University of Washington   (United States)

Author keywords

Chip identification; low power digital electronics; mismatch; process variations; RFID; sensor networks

Indexed keywords

EID: 85008008223     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.2007.910961     Document Type: Article

References (6)

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