Chip identification using the characteristic dispersion of transistor

Proceedings of the Asian Test Symposium

Volumn 2005, Issue , 2005, Pages 188-191

  Hirase, Junichi ^a   Furukawa, Tatsuya ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP ID (IDENTIFICATION); CHIP IDENTIFICATION; MINIATURIZATION;

DISPERSION (WAVES); IDENTIFICATION (CONTROL SYSTEMS); QUALITY ASSURANCE; TRANSISTORS;

MICROPROCESSOR CHIPS;

EID: 33846922353     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2005.35     Document Type: Conference Paper

References (3)

1. M. Alavi, M. Bohr, J. Hicks, M. Denham, A. Cassens, D. Douglas & M. Tsai, "A PROM element based on salicide agglomeration of poly fuses in a CMOS logic process," IEDM., 1997.
2. K. Lofstrom, W. Daasch & D. Taylor, "IC identification circuit using device mismatch," Solid-State Circuits Conference, 2000.
3. A. Cabbio, J. Conder & M. Jacobs, "Feed Forward Test Methodology Utilizing Device Identification," Proc. International Test Conference, pp655-660. Oct. 2004.