Development of an Ad-Hoc Aberration Auto-tuning Procedure on an Oriented Crystalline Specimen in Aberration-Corrected Scanning Transmission Electron Microscopy: The SIAM Method

Microscopy and Microanalysis

Volumn 18, Issue S2, 2012, Pages 334-335

  Sawada, H ^a   Watanabe, M ^b  

^a JEOL LTD   (Japan)

^b Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85007972753     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612003522     Document Type: Article

References (5)

1. S.J. Pennycook&P.D. Nellist ed. Scanning Transmission Electron Microscopy: Imaging and Analysis, Springer, NY, (2011).
2. M. Haider, et al., Ultramicrosc., 81 (2000), 163.
3. N. Dellby, et al., J. Electron Microsc., 50 (2001), 177.
4. H. Sawada, et al., Ultramicrosc. 108 (2008), 1467.
5. H. Sawada, et al., Microsc. Microanal. 17 (2011), Suppl. 2, 1308.