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Volumn 34, Issue 7, 2015, Pages 1081-1093

A critical look at prospective surveillance using a scan statistic

Author keywords

average run length; p value; recurrence interval; scan statistic

Indexed keywords

ARTICLE; DISEASE SURVEILLANCE; EPIDEMIC; PROBABILITY; SCAN STATISTIC; SOFTWARE; STATISTICS; STIMULATION;

EID: 85006445303     PISSN: 02776715     EISSN: 10970258     Source Type: Journal    
DOI: 10.1002/sim.6400     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.