Ultrafast Electron Diffraction Tomography for Structure Determination of the New Zeolite ITQ-58

Journal of the American Chemical Society

Volumn 138, Issue 32, 2016, Pages 10116-10119

  Simancas, Jorge ^a   Simancas, Raquel ^a   Bereciartua, Pablo J ^a   Jorda, Jose L ^a   Rey, Fernando ^a   Corma, Avelino ^a   Nicolopoulos, Stavros ^b   Pratim Das, Partha ^b,c   Gemmi, Mauro ^d   Mugnaioli, Enrico ^d,e  

^a CSIC   (Spain)

^b NanoMEGAS   (Belgium)

^c Orense 8   (Spain)

^d ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

^e UNIVERSITY OF SIENA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; DATA ACQUISITION; ELECTRON DIFFRACTION; ELECTRONS; RADIATION DAMAGE; TOMOGRAPHY;

COMPLEX STRUCTURE; DATA COLLECTION STRATEGIES; DIFFRACTION TOMOGRAPHY; SENSITIVE MATERIALS; STATE-OF-THE-ART TECHNIQUES; STRUCTURE DETERMINATION; ULTRAFAST ELECTRON DIFFRACTION; ZEOLITIC STRUCTURE;

MICROPOROUS MATERIALS;

OXYGEN; SILICON; ZEOLITE;

ARTICLE; CELL VOLUME; CHEMICAL STRUCTURE; ELECTRON BEAM; ELECTRON MICROSCOPE; ELECTRON TOMOGRAPHY; METHODOLOGY; RADIATION INJURY; ULTRAFAST ELECTRON DIFFRACTION TOMOGRAPHY;

EID: 84983394188     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/jacs.6b06394     Document Type: Article

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