Fast electron diffraction tomography

Journal of Applied Crystallography

Volumn 48, Issue , 2015, Pages 718-727

  Gemmi, Mauro ^a   La Placa, Maria G I ^a   Galanis, Athanassios S ^b   Rauch, Edgar F ^c   Nicolopoulos, Stavros ^b  

^a CENTER FOR NANOTECHNOLOGY INNOVATION NEST   (Italy)

^b NanoMEGAS   (Belgium)

^c CNRS   (France)

Author keywords

direct methods; electron diffraction; electron diffraction tomography; precession electron diffraction; structure solution

Indexed keywords

DATA ACQUISITION; ELECTRON DIFFRACTION; ELECTRONS; GONIOMETERS; TOMOGRAPHY;

AUTOMATIC DATA COLLECTION; AUTOMATIC PROCEDURES; CONTINUOUS ROTATION; DIFFRACTION TOMOGRAPHY; DIRECT METHOD; PRECESSION ELECTRON DIFFRACTIONS; STRUCTURE SOLUTIONS; UNIT CELL PARAMETERS;

CRYSTAL STRUCTURE;

EID: 84930631776     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576715004604     Document Type: Article

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