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Volumn , Issue , 2001, Pages 133-144

Athermal annealing of ion-implanted silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DOPING (ADDITIVES); HEAT TREATMENT;

EID: 84983190413     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RTP.2001.1013757     Document Type: Conference Paper
Times cited : (2)

References (30)
  • 17
    • 84983171036 scopus 로고    scopus 로고
    • J. Bennett, Private Communication
    • J. Bennett, Private Communication
  • 21
    • 84983110078 scopus 로고    scopus 로고
    • AZ PN114 manufactured by Clariant
    • AZ PN114 manufactured by Clariant
  • 27
  • 28
  • 30
    • 84983157671 scopus 로고    scopus 로고
    • Quantitative Acoustic Emission Waveform Measurements Using Laser Interferometer Probes
    • IPC Science and Technology Press, Ltd
    • B.B. Djordjevic, and R.E. Green, Jr., "Quantitative Acoustic Emission Waveform Measurements Using Laser Interferometer Probes," Proc. Ultrasonic Int. 81 Conf., 253-258, IPC Science and Technology Press, Ltd.
    • Proc. Ultrasonic Int. 81 Conf. , pp. 253-258
    • Djordjevic, B.B.1    Green, R.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.