Effects of radiative properties of surfaces on radiometric temperature measurement

9th International Conference on Advanced Thermal Processing of Semiconductors, RTP 2001

Volumn , Issue , 2001, Pages 179-188

  Zhou, Y H ^a   Zhang, Z M ^a   DeWitt, D P ^b   Tsai, B K ^b  

^a UNIVERSITY OF FLORIDA   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

BRDF; effective emissivity; Monte Carlo method; radiometric temperature measurement; rapid thermal processing

Indexed keywords

ANGULAR DISTRIBUTION; DISTRIBUTION FUNCTIONS; ELECTROMAGNETIC WAVE EMISSION; HEAT TREATMENT; RADIOMETRY; RAPID THERMAL PROCESSING; SURFACE ROUGHNESS; TEMPERATURE MEASUREMENT;

BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTIONS; BRDF; EFFECTIVE EMISSIVITY; MONTE CARLO MODEL; NUMERICAL APERTURE; RADIATIVE PROCESS; RADIATIVE PROPERTIES; RADIOMETRIC TEMPERATURE MEASUREMENT;

MONTE CARLO METHODS;

EID: 84983146125     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RTP.2001.1013764     Document Type: Conference Paper

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