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Volumn 579, Issue , 2016, Pages 277-305

Refinement of Atomic Structures Against cryo-EM Maps

Author keywords

Atomic structure refinement; Bayesian statistics; Best map calculation; Crystallographic maps; Electron scattering; Form factors; Sharpening and blurring; X ray diffraction

Indexed keywords

CONFORMATION; CRYOELECTRON MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; MACROMOLECULE; PROBABILITY; RANDOM ERROR; ALGORITHM; BAYES THEOREM; DEVICES; IMAGE PROCESSING; MOLECULAR MODEL; PROCEDURES; PROTEIN CONFORMATION; SOFTWARE; STATISTICS AND NUMERICAL DATA; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

EID: 84977542628     PISSN: 00766879     EISSN: 15577988     Source Type: Book Series    
DOI: 10.1016/bs.mie.2016.05.033     Document Type: Chapter
Times cited : (37)

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