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Volumn 2003-January, Issue , 2003, Pages 158-161

Automated antenna detection and correction methodology in VLSI designs

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNAS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; DESIGN;

EID: 84973645297     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PPID.2003.1200947     Document Type: Conference Paper
Times cited : (13)

References (6)
  • 1
    • 0034499076 scopus 로고    scopus 로고
    • Relationship between yield and reliability impact of plasma damage to gate oxide
    • P.W. Mason, D.K. DeBusk, J.K. McDaniel, A.S. Oates, K.P. Cheung, "Relationship between yield and reliability impact of plasma damage to gate oxide", P2ID, 2000, P. 2-5.
    • (2000) P2ID , pp. 2-5
    • Mason, P.W.1    DeBusk, D.K.2    McDaniel, J.K.3    Oates, A.S.4    Cheung, K.P.5
  • 2
    • 0032256633 scopus 로고    scopus 로고
    • Antenna device reliability for ULSI processing
    • S. Krishnan, A. Amerasekera, S. Rangan, S. Aur, "Antenna device reliability for ULSI processing", IEDM, 1998, P. 601.
    • (1998) IEDM , pp. 601
    • Krishnan, S.1    Amerasekera, A.2    Rangan, S.3    Aur, S.4
  • 6
    • 0031652342 scopus 로고    scopus 로고
    • Antenna protection strategy for ultra-thin gate MOSFETs
    • Krishnan, S. Amerasekera, A.; Antenna protection strategy for ultra-thin gate MOSFETs, IRPS, 1998.
    • (1998) IRPS
    • Krishnan, S.1    Amerasekera, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.