Quantifying a simple antenna design rule

International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings

Volumn , Issue , 2000, Pages 153-156

  Gabriel, Calvin T ^a   de Muizon, Emmanuel ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNAS; CMOS INTEGRATED CIRCUITS; COMPUTER SOFTWARE; DIELECTRIC MATERIALS; ELECTRIC CONDUCTORS; GATES (TRANSISTOR); PLASMA INTERACTIONS; SILICON WAFERS;

ANTENNA DESIGN RULE; METAL ANTENNA RATIO;

PLASMA DEVICES;

EID: 0034511269     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)