Schottky barrier height inhomogeneities of nickel mono-silicide/n-Si contact studied by I-V-T technique

2001 6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Proceedings

Volumn 1, Issue , 2001, Pages 505-508

  Jiang, Yu Long ^a   Tian, Yun ^a   Ru, Guo Ping ^a   Han, Yong Zhao ^a   Lu, Fang ^a   Li, Bing Zong ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84966656956     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSICT.2001.981528     Document Type: Conference Paper

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