Convergence, Admissibility, and Fit of Alternative Confirmatory Factor Analysis Models for MTMM Data

Educational and Psychological Measurement

Volumn 76, Issue 3, 2016, Pages 487-507

  Lance, Charles E ^a,b   Fan, Yi ^c  

^a Organizational Research Development   (United States)

^b UNIVERSITY OF THE WESTERN CAPE   (South Africa)

^c UNIVERSITY OF GEORGIA   (United States)

Author keywords

construct validity; model comparisons; MTMM; multitrait multimethod

Indexed keywords

EID: 84964901240     PISSN: 00131644     EISSN: 15523888     Source Type: Journal    
DOI: 10.1177/0013164415601884     Document Type: Article

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