메뉴 건너뛰기




Volumn , Issue , 2016, Pages 536-543

A flexible architecture for systematic implementation of SoC security policies

Author keywords

[No Author keywords available]

Indexed keywords

CODE CONVERTERS; COMMERCE; COMPUTER AIDED DESIGN; DESIGN; FIRMWARE; SECURITY SYSTEMS; SYSTEM-ON-CHIP;

EID: 84964425579     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2015.7372616     Document Type: Conference Paper
Times cited : (44)

References (18)
  • 6
    • 84964526045 scopus 로고    scopus 로고
    • Discussion topic: What is the old security paradigm
    • S. J. Greenwald, "Discussion Topic: What is the Old Security Paradigm," in Workshop on New Security Paradigms, 1998, pp. 107-118.
    • (1998) Workshop on New Security Paradigms , pp. 107-118
    • Greenwald, S.J.1
  • 7
    • 84984889445 scopus 로고    scopus 로고
    • ConXsense: Automated context classification for context-aware access control
    • M. Miettinen, S. Heuser, W. Kronz, A. Sadeghi, and N. Ashokan, "ConXsense: automated context classification for context-aware access control," in ASIACCS, 2014, pp. 293-304.
    • (2014) ASIACCS , pp. 293-304
    • Miettinen, M.1    Heuser, S.2    Kronz, W.3    Sadeghi, A.4    Ashokan, N.5
  • 12
    • 0023558367 scopus 로고
    • Recognizing safety and liveness
    • B. Alper and F. B. Schneider, "Recognizing Safety and Liveness," Distributed Computing, vol. 2, no. 3, pp. 117-126, 1987.
    • (1987) Distributed Computing , vol.2 , Issue.3 , pp. 117-126
    • Alper, B.1    Schneider, F.B.2
  • 14
    • 84964431881 scopus 로고    scopus 로고
    • "www. opencores. com. "
  • 17
    • 84896491283 scopus 로고    scopus 로고
    • Counterfeit integrated circuits: Detection, avoidance, and the challenges ahead
    • U. Guin, D. DiMase, and M. Tehranipoor, "Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead," Journal of Electronic Testing, vol. 30, no. 1, pp. 25-40, 2014.
    • (2014) Journal of Electronic Testing , vol.30 , Issue.1 , pp. 25-40
    • Guin, U.1    DiMase, D.2    Tehranipoor, M.3
  • 18
    • 0036443181 scopus 로고    scopus 로고
    • Embedded memory test and repair: Infrastructure IP for SOC yield
    • Y. Zorian, "Embedded memory test and repair: Infrastructure IP for SOC yield," in International Test Conference, 2002, pp. 340-349.
    • (2002) International Test Conference , pp. 340-349
    • Zorian, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.