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Volumn 44, Issue 10 PART 1, 1996, Pages 1725-1728

Microwave noise characterization of two-port devices using an uncalibrated tuner

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC IMPEDANCE; ELECTRIC NETWORK ANALYZERS; ELECTRIC SWITCHES; GAIN MEASUREMENT; MESFET DEVICES; MICROWAVES; SEMICONDUCTING GALLIUM ARSENIDE; SIGNAL RECEIVERS; STANDARDS; TUNERS; TUNING;

EID: 0030258747     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.538965     Document Type: Article
Times cited : (2)

References (11)
  • 10
    • 33747270956 scopus 로고    scopus 로고
    • RF and Microwave Semiconductors. Ca. Eastern Eab., pp. 1-94, 1994.
    • NEC Data Book, RF and Microwave Semiconductors. Ca. Eastern Eab., pp. 1-94, 1994.
    • NEC Data Book
  • 11
    • 33747217091 scopus 로고    scopus 로고
    • Design Parameter Library, Vers. 6, Ca. Eastern Lab.
    • NEC Microwave Semiconductor Devices, Design Parameter Library, Vers. 6, Ca. Eastern Lab.
    • NEC Microwave Semiconductor Devices


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.