-
1
-
-
0024738288
-
-
37, no. 9, Sept. 1989, pp. 1340-1350.
-
M. W. Pospieszalski, ''Modeling of noise parameters of MESFET's and their frequency and temperature dependence. IEEE Trans. Microwave Theory Tech., vol. 37, no. 9, Sept. 1989, pp. 1340-1350.
-
''Modeling of Noise Parameters of MESFET's and Their Frequency and Temperature Dependence. IEEE Trans. Microwave Theory Tech., Vol.
-
-
Pospieszalski, M.W.1
-
2
-
-
0027189134
-
-
50 ohm measurement system, in 1993 MTT-S Int. Microwave Symp. Dig., pp. 1251-1254.
-
[21 P. J. Tasker, W. Reinert, B. Hughes, J. Braunstein, and M. Schlechtweg, Transistor noise parameter extraction using 50 ohm measurement system, in 1993 MTT-S Int. Microwave Symp. Dig., pp. 1251-1254.
-
W. Reinert, B. Hughes, J. Braunstein, and M. Schlechtweg, Transistor Noise Parameter Extraction Using
-
-
Tasker, P.J.1
-
3
-
-
0023104731
-
-
1, pp. 71-75, Jan. 1987.
-
G. Martines and M. Sannino, ''A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters, IEEE Trans. Microwave Theory Tech., vol. M'l T-35, no. 1, pp. 71-75, Jan. 1987.
-
''A Method for Measurement of Losses in the Noise-matching Microwave Network while Measuring Transistor Noise Parameters, IEEE Trans. Microwave Theory Tech., Vol. M'l T-35, No.
-
-
Martines, G.1
Sannino, M.2
-
5
-
-
0027554576
-
-
41, no. 3, Mar. 1993.
-
L. Escotte, R. Plana, and J. Graffeuil, Evaluation of Noise Parameter Extraction Methods. lEEETruns. Microwave Theory Tech., vul. 41, no. 3, Mar. 1993.
-
R. Plana, and J. Graffeuil, Evaluation of Noise Parameter Extraction Methods. LEEETruns. Microwave Theory Tech., Vul.
-
-
Escotte, L.1
-
7
-
-
0018720739
-
-
27, no. 12, pp. 987-993, Dec. 1979.
-
G. F. Engen and C. A. Hoer, Thru-reflect-line: An improved technique for calibrating the dual six-port automatique network analyser, IEEE Trans. Microwave Theory Tech.. vol. 27, no. 12, pp. 987-993, Dec. 1979.
-
Thru-reflect-line: An Improved Technique for Calibrating the Dual Six-port Automatique Network Analyser, IEEE Trans. Microwave Theory Tech.. Vol.
-
-
Engen, G.F.1
Hoer, C.A.2
-
8
-
-
0024765129
-
-
37, no. 11 , pp. 1675-1680, Nov. 1989.
-
R. Pantoja et ai., Improved calibration and measurement of the scattering parameters of microwave integrated circuits, IEEE Trans. Microwave Theory Tech., vol. 37, no. 11 , pp. 1675-1680, Nov. 1989.
-
Improved Calibration and Measurement of the Scattering Parameters of Microwave Integrated Circuits, IEEE Trans. Microwave Theory Tech., Vol.
-
-
Pantoja, R.1
-
9
-
-
0024607281
-
-
25, no. 4, Feb. 16, 1989.
-
G. Vasilescu, G. Alquie, and M. Krim, Exact computation of two-port noise parameters, Electron. Lett., vol. 25, no. 4, Feb. 16, 1989.
-
G. Alquie, and M. Krim, Exact Computation of Two-port Noise Parameters, Electron. Lett., Vol.
-
-
Vasilescu, G.1
-
10
-
-
33747270956
-
-
RF and Microwave Semiconductors. Ca. Eastern Eab., pp. 1-94, 1994.
-
NEC Data Book, RF and Microwave Semiconductors. Ca. Eastern Eab., pp. 1-94, 1994.
-
NEC Data Book
-
-
-
11
-
-
33747217091
-
-
Design Parameter Library, Vers. 6, Ca. Eastern Lab.
-
NEC Microwave Semiconductor Devices, Design Parameter Library, Vers. 6, Ca. Eastern Lab.
-
NEC Microwave Semiconductor Devices
-
-
|