A Highly Sensitive Diketopyrrolopyrrole-Based Ambipolar Transistor for Selective Detection and Discrimination of Xylene Isomers

Advanced Materials

Volumn 28, Issue 21, 2016, Pages 4012-4018

  Wang, Bin ^a   Huynh, Tan Phat ^a   Wu, Weiwei ^a   Hayek, Naseem ^a   Do, Thu Trang ^b   Cancilla, John C ^c   Torrecilla, Jose S ^c   Nahid, Masrur Morshed ^d   Colwell, John M ^b   Gazit, Oz M ^a   Puniredd, Sreenivasa Reddy ^e   McNeill, Christopher R ^d   Sonar, Prashant ^b   Haick, Hossam ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

^c UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^d MONASH UNIVERSITY   (Australia)

^e INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

ambipolar; diketopyrrolopyrrole; isomers; sensors; xylene

Indexed keywords

SENSORS; XYLENE;

ALTERNATING COPOLYMER; AMBIPOLAR; AMBIPOLAR TRANSISTORS; DIKETOPYRROLOPYRROLES; ELD-EFFECT TRANSISTORS; LONG TERM EXPOSURE; SELECTIVE DETECTION; STILLE COUPLING;

ISOMERS;

EID: 84962505697     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201505641     Document Type: Article

References (25)

1. J. Fabri, U. Graeser, T. A. Simo, Xylenes. in Ullmann's Encyclopedia of Industrial Chemistry, Wiley-VCH, Weinheim, Germany 2000, p. 643.
2. a) The National Institute for Occupational Safety and Health, NIOSH Pocket Guide to Chemical Hazards, http://www.cdc.gov/niosh/npg/npgd0669.html, accessed: October 2015;
3. b) Agency for Toxic Substances & Disease Registry, Toxicological Profile for Xylene, http://www.atsdr.cdc.gov/ToxProfiles/tp.asp?id=296&tid=53, accessed: October 2015.
4. C. Morton, Handbook of Hazardous Materials, 1st ed., Academic Press, Inc., San Diego, CA, USA 1993.
5. a) Z. Y. Gu, X. P. Yan, Angew. Chem. Int. Ed. 2010, 49, 1477;
6. b) Z. Y. Gu, X. P. Yan, Angew. Chem. 2010, 122, 1519.
7. F. L. Dickert, O. Hayden, M. E. Zenkel, Anal. Chem. 1999, 71, 1338.
8. a) F. Wang, Y. Yang, T. M. Swager, Angew. Chem. Int. Ed. 2008, 47, 8394;
9. b) F. Wang, Y. Yang, T. M. Swager, Angew. Chem. 2008, 120, 8522.
10. a) H. J. Kim, J. W. Yoon, K. I. Choi, H. W. Jang, A. Umar, J. H. Lee, Nanoscale 2013, 5, 7066;
11. b) H. S. Woo, C. H. Kwak, J. H. Chung, J. H. Lee, ACS Appl. Mater. Interfaces 2014, 6, 22553;
12. c) S. C. Hernandez, C. M. Hangarter, A. Mulchandani, N. V. Myung, Analyst 2012, 137, 2549.
13. S. F. Li, J. Z. Zheng, W. X. Zhang, J. Cao, S. X. Li, Z. M. Rao, Analyst 2013, 138, 916.
14. a) Y. N. Li, P. Sonar, L. Murphy, W. Hong, Energy Environ. Sci. 2013, 6, 1684;
15. b) P. Sonar, S. P. Singh, Y. N. Li, M. S. Soh, A. Dodabalapur, Adv. Mater. 2010, 22, 5409;
16. c) Z. R. Yi, S. Wang, Y. Q. Liu, Adv. Mater. 2015, 27, 3589.
17. a) J. C. Bijleveld, A. P. Zoombelt, S. G. J. Mathijssen, M. M. Wienk, M. Turbiez, D. M. de Leeuw, R. A. J. Janssen, J. Am. Chem. Soc. 2009, 131, 16616;
18. b) J. S. Lee, S. K. Son, S. Song, H. Kim, D. R. Lee, K. Kim, M. J. Ko, D. H. Choi, B. S. Kim, J. H. Cho, Chem. Mater. 2012, 24, 1316.
19. a) S. Stewart, M. A. Ivy, E. V. Anslyn, Chem. Soc. Rev. 2014, 43, 70;
20. b) B. Wang, J. C. Cancilla, J. S. Torrecilla, H. Haick, Nano Lett. 2014, 14, 933.
21. M. C. Janzen, J. B. Ponder, D. P. Bailey, C. K. Ingison, K. S. Suslick, Anal. Chem. 2006, 78, 3591.
22. a) A. Facchetti, M. Mushrush, M. H. Yoon, G. R. Hutchison, M. A. Ratner, T. J. Marks, J. Am. Chem. Soc. 2004, 126, 13859;
23. b) H. Usta, C. Risko, Z. Wang, H. Huang, M. K. Deliomeroglu, A. Zhukhovitskiy, A. Facchetti, T. J. Marks, J. Am. Chem. Soc. 2009, 131, 5586.
24. a) X. Zhang, L. J. Richter, D. M. DeLongchamp, R. J. Kline, M. R. Hammond, I. McCulloch, M. Heeney, R. S. Ashraf, J. N. Smith, T. D. Anthopoulos, B. Schroeder, Y. H. Geerts, D. A. Fischer, M. F. Toney, J. Am. Chem. Soc. 2011, 133, 15073;
25. b) R. M. Silverstein, F. X. Webster, D. J. Kiemle, Spectrometric Identification of Organic Compounds, John Wiley & Sons, Hoboken, NJ, USA 2005.