A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates

57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001

Volumn , Issue , 2001, Pages

  Peterson, Rebecca L ^a,b   Drayton, Rhonda F ^a  

^a University of Minnesota   (United States)

^b Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COPLANAR WAVEGUIDES; DIELECTRIC MATERIALS; ELECTRONICS PACKAGING; INTERSECTIONS; MICROWAVE MEASUREMENT; RESONATORS; SUBSTRATES;

CHARACTERIZATION TECHNIQUES; EFFECTIVE DIELECTRIC CONSTANTS; ELECTRICAL CHARACTERIZATION; FINITE-GROUND COPLANAR WAVEGUIDES; HIGH RESISTIVITY SILICON; HIGH-RESISTIVITY SILICON SUBSTRATE; MICROWAVE MATERIALS; MICROWAVE SUBSTRATES;

MICROWAVE RESONATORS;

EID: 84962343721     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2001.327463     Document Type: Conference Paper

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