Significant subgraph mining with multiple testing correction

SIAM International Conference on Data Mining 2015, SDM 2015

Volumn , Issue , 2015, Pages 37-45

  Sugiyama, Mahito ^a,b   López, Felipe Limares ^c   Kasenburg, Niklas ^d   Borgwardt, Karsten M ^c  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c ETH ZURICH   (Switzerland)

^d UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

Bonferroni correction; Frequent subgraph mining; Multiple hypothesis testing; Statistical significance; Testability

Indexed keywords

BONFERRONI CORRECTION; FREQUENT SUBGRAPH MINING; MULTIPLE HYPOTHESIS TESTING; STATISTICAL SIGNIFICANCE; TESTABILITY;

DATA MINING;

EID: 84961916277     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1137/1.9781611974010.5     Document Type: Conference Paper

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