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Volumn , Issue , 2015, Pages

21 % p-type industrial perc cells with homogeneous emitter profile and thermally grown oxidation layer

Author keywords

anneal; PERC; silicon; solar cells

Indexed keywords

ANNEALING; SILICON; SILVER; SOLAR CELLS;

EID: 84961615847     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2015.7356057     Document Type: Conference Paper
Times cited : (4)

References (9)
  • 3
    • 0019579322 scopus 로고
    • Electrical properties and stability of supersaturated phosphorus-doped silicon layers
    • M. Finetti, P. Negrini, S. Solmi, and D. Nobili, "Electrical properties and stability of supersaturated phosphorus-doped silicon layers, "Journal of the Electrochemical Society 128 ( 1981) pp 1313-1317.
    • (1981) Journal of the Electrochemical Society , vol.128 , pp. 1313-1317
    • Finetti, M.1    Negrini, P.2    Solmi, S.3    Nobili, D.4
  • 5
    • 72049098456 scopus 로고    scopus 로고
    • Laser doping technique using ultraviolet laser for shallow doping in crystalline silicon solar cell fabrication
    • A. Ogane, K. Hirata, K. Horiuchi, Y. Nishihara, Y. Takahashi, A. Kitiyanan and Takashi Fuyuki, "Laser doping technique using ultraviolet laser for shallow doping in crystalline silicon solar cell fabrication", Jpn. J. Appl. Phys. 48 (2009) 07 120 I.
    • (2009) Jpn. J. Appl. Phys. , vol.48 , pp. 071201
    • Ogane, A.1    Hirata, K.2    Horiuchi, K.3    Nishihara, Y.4    Takahashi, Y.5    Kitiyanan, A.6    Fuyuki, T.7
  • 8
    • 0000513411 scopus 로고    scopus 로고
    • Contactless determination of currentvoltage characteristics and minority carrier lifetimes in semiconductors from quasi-steady-state photoconductance data
    • R. Sinton, A. Cuevas, "Contactless determination of currentvoltage characteristics and minority carrier lifetimes in semiconductors from quasi-steady-state photoconductance data, "Applied Physics Letters 69 ( 1996) 25 10-25 12
    • (1996) Applied Physics Letters , vol.69 , pp. 2510-2512
    • Sinton, R.1    Cuevas, A.2
  • 9
    • 0022306789 scopus 로고
    • Measurement of the emitter saturation current by a contactless photoconductivity decay method
    • Las Vegas, Nevada
    • D. E. Kane, R. M. Swanson, "Measurement of the emitter saturation current by a contactless photoconductivity decay method, " in Proceedings of the 18th IEEE Photovoltaic Specialists Conference, Las Vegas, Nevada, 1985, pp. 578-583.
    • (1985) Proceedings of the 18th IEEE Photovoltaic Specialists Conference , pp. 578-583
    • Kane, D.E.1    Swanson, R.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.