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Volumn 115, Issue , 2016, Pages 128-132

Grain growth: The key to understand solid-state dewetting of silver thin films

Author keywords

Grain growth; Scanning electron microscopy; Solid state dewetting; Surface diffusion; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILVER; SINTERING; SURFACE DIFFUSION; THIN FILMS;

EID: 84960502014     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2016.01.005     Document Type: Article
Times cited : (56)

References (23)
  • 3
    • 84929223561 scopus 로고    scopus 로고
    • J. Ye Sci. Rep. 5 2015 November 2014 9823
    • (2014) Sci. Rep. , vol.5 , Issue.2015 November , pp. 9823
    • Ye, J.1
  • 11
    • 84864273234 scopus 로고
    • The Mobility of the surface atoms of copper and silver evaporated deposits
    • R. Brandon, and F.J. Bradshaw The Mobility of the surface atoms of copper and silver evaporated deposits Royal Aircraft Establishment, Tech. Rep. 1966 (66093)
    • (1966) Royal Aircraft Establishment, Tech. Rep. , pp. 66093
    • Brandon, R.1    Bradshaw, F.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.