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Volumn 115, Issue , 2016, Pages 128-132
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Grain growth: The key to understand solid-state dewetting of silver thin films
a,b c c a a b b |
Author keywords
Grain growth; Scanning electron microscopy; Solid state dewetting; Surface diffusion; Thin films
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRON MICROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILVER;
SINTERING;
SURFACE DIFFUSION;
THIN FILMS;
DE-WETTING;
ENVIRONMENTAL SCANNING ELECTRON MICROSCOPIES (ESEM);
HIGH TEMPERATURE;
OXYGEN ATMOSPHERE;
POLYCRYSTALLINE SILVER;
REAL TIME;
SELECTIVE GRAIN GROWTH;
SILVER THIN FILMS;
GRAIN GROWTH;
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EID: 84960502014
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2016.01.005 Document Type: Article |
Times cited : (56)
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References (23)
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