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Volumn , Issue , 2000, Pages

Modeling Load Variations with Artificial Neural Networks to Improve On-Wafer OSLT Calibrations

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; NEURAL NETWORKS; STANDARDS;

EID: 84960451180     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2000.327430     Document Type: Conference Paper
Times cited : (4)

References (17)
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  • 12
    • 0031338936 scopus 로고    scopus 로고
    • Knowledge-based neural models for microwave design
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    • 0031385920 scopus 로고    scopus 로고
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.