Artificial neural network modeling for improved on-wafer OSLT calibration standards

International Journal of RF and Microwave Computer-Aided Engineering

Volumn 10, Issue 5, 2000, Pages 319-328

  Jargon, Jeffrey A ^a,b,c,d,e   Gupta, K C ^{b,f,g,h,i,j,k,l,m,n,o,p,q,r,s,t}   DeGroot, Donald C ^a,b,u,v,w  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

^c University of Colorado ^*

^d Tau Beta Pi   (United States)

^e State of Colorado   (United States)

^f INDIAN INSTITUTE OF SCIENCE   (India)

^g BIRLA INSTITUTE OF TECHNOLOGY AND SCIENCE   (India)

^h INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

ⁱ UNIVERSITY OF WATERLOO   (Canada)

^j EPFL   (Switzerland)

^k TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^l ETH ZURICH   (Switzerland)

^m UNIVERSITY OF KANSAS   (United States)

ⁿ INDIAN INSTITUTE OF TECHNOLOGY   (India)

^o Indian Telephone Industries   (India)

^p IEEE   (United States)

^q Inst Electronics T   (India)

^r URSI   (United States)

^s Electromagnetics Academy   (United States)

^t Andrews University   (United States)

^u ANDREWS UNIVERSITY   (United States)

^v NORTHWESTERN UNIVERSITY   (United States)

^w NIST RF Electronics Group

more..

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; BENCHMARKING; CALIBRATION; ERROR ANALYSIS; LEARNING SYSTEMS; MATHEMATICAL MODELS; NEURAL NETWORKS; STANDARDS;

MULTILINE THRU-REFLECT-LINE (TRL) CALIBRATION; OPEN-SHORT-LOAD-THRU (OSLT) STANDARDS; VECTOR NETWORK ANALYZERS (VNA);

ELECTRIC NETWORK ANALYZERS;

EID: 0034259625     PISSN: 10964290     EISSN: None     Source Type: None    
DOI: 10.1002/1099-047X(200009)10:5<319::AID-MMCE7>3.0.CO;2-5     Document Type: Article

References (20)

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