On-line bisted SRAM IP core

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 993-1000

  Lobetti Bodoni, Monica ^a   Pricco, Alessio ^a   Benso, Alfredo ^a   Chiusano, Silvia ^a   Prinetto, Paolo ^a  

^a Italtel SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTRAINT THEORY; FAULT TOLERANT COMPUTER SYSTEMS; INTELLECTUAL PROPERTY; MULTICHIP MODULES; ONLINE SYSTEMS; RANDOM ACCESS STORAGE; TELECOMMUNICATION SYSTEMS;

DIGITAL SYSTEM DESIGN; FAULT DETECTION; INTELLECTUAL PROPERTY CORE; STATIC RANDOM ACCESS MEMORY;

BUILT-IN SELF TEST;

EID: 0033317233     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)