Accurate Characterization of Fringing Effects at On-Chip Line Steps

56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000

Volumn , Issue , 2000, Pages

  Winkel, Thomas Michael ^a   Dutta, Lohit Sagar ^b   Grabinski, Hartmut ^b  

^a IBM   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FRINGING EFFECTS; OFF-CHIP INTERCONNECTS; ON CHIPS; SCATTERING FIELD;

INTEGRATED CIRCUIT INTERCONNECTS;

EID: 84960406267     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2000.327445     Document Type: Conference Paper

References (10)

1. Cascade Microtech, "Microwave Wafer Probe Calibration Constants", Instruction Manual
2. Thomas-Michael Winkel, Lohit Sagar Dutta, Hartmut Grabinski, "An Accurate Determination of the Characteristic Impedance of Lossy Lines on Chips Based on High Frequency S-Parameter Measurements", IEEE Multi-Chip Module Conference MCMC'96, pp. 190-195, February 1996
3. Thomas-Michael Winkel, Lohit Sagar Dutta, Hartmut Grabinski, "An Accurate Determination of the Characteristic Impedance Matrix of Coupled Symmetrical Lines on Chips Based on High Frequency S-Parameter Measurements", 1997 IEEE-MTT-S International Microwave Symposium, Vol. 3, pp. 1769-1772, June 1997
4. Thomas-Michael Winkel, "Untersuchung der Kopplung zwischen Leitungen auf Silizium-Substraten unterschiedlicher Leitfähigkeit unter Verwendung breitbandiger Messungen", Ph D. Thesis, University of Hannover, November 1997
5. Norman R. Franzen and Ross A. Speciale, "A New Procedure for System Calibration and Error Removal in Automated S-Parameter Measurements", European Microwave Conference Proceedings, pp. 69-73, 1975
6. G. F. Engen and C. A. Hoer, "Thru-reflect-line, an improved technique for calibrating the dual six-port automatic network analyzer",IEEE Transactions on Microwave Theory and Techniques, vol. MTT-27, pp.987-992, Dec.1979
7. Kimmo J. Silvonen, "A general approach to network calibration", IEEE Transactions on Microwave Theory and Techniques, vol.40, pp. 754-759, April 1992
8. H.-J.Eul and B. Schiek, "A Generalized Theory and New Calibration Procedures for Network Analyzer Self-Calibration", IEEE Transactions on Microwave Theory and Techniques, vol.39, pp.724-731, April 1991
9. H. Van Hamme and M. Vanden Bossche, "Flexible Vector Network Analyzer Calibration with Accuracy Bounds Using an 8-Term or a 16-Term Error Correction Model", IEEE Transactions on Microwave Theory and Techniques, vol.42, no.6, pp.976-987, June 1994
10. Thomas-Michael Winkel, Lohit Sagar Dutta, Hartmut Grabinski, "An On-Wafer Deembedding Procedure for Devices under Measurement with Error-Networks Containing Arbitrary Line Lengths", 47th ARFTG Conference Spring 1996, pp. 102-111, June 20-21, 1996