An on-wafer deembedding procedure for devices under measurement with error-networks containing arbitrary line lengths

47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996

Volumn , Issue , 1996, Pages 102-111

  Winkel, Thomas Michael ^a   Dutta, Lohit Sagar ^a   Grabinski, Hartmut ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SCATTERING PARAMETERS;

CHARACTERISTIC IMPEDANCE; CONTACT STRUCTURE; DE-EMBEDDING METHOD; HIGH FREQUENCY HF; ON-WAFER DEEMBEDDING; PARAMETER MATRICES; PROPAGATION CONSTANT; S-PARAMETER MEASUREMENTS;

ERRORS;

EID: 15944400532     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1996.327170     Document Type: Conference Paper

References (8)

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2. G. F. Engen and C. A. Hoer, "Thru-reflect-line, an improved technique for calibrating the dual six-port automatic network analyzer", IEEE Transactions on Microwave Theory and Techniques, vol. MTT-27, pp.987-992, Dec. 1979
3. Kimmo J. Silvonen, "A general approach to network calibration", IEEE Transactions on Microwave Theory and Techniques, vol.40, pp. 754-759, April 1992
4. H.-J.Eul and B. Schiek, "A Generalized Theory and New Calibration Procedures for Network Analyzer Self-Calibration", IEEE Transactions on Microwave Theory and Techniques, vol.39, pp.724-731, April 1991
5. H. Van Hamme and M. Vanden Bossche, "Flexible Vector Network Analyzer Calibration with Accuracy Bounds Using an 8-Term or a 16-Term Error Correction Model", IEEE Transactions on Microwave Theory and Techniques, vol.42, no.6, pp.976-987, June 1994
6. Thomas-Michael Winkel, Lohit Sagar Dutta, Hartmut Grabinski, "An Accurate Determination of the Characteristic Impedance of Lossy Lines on Chips Based on High Frequency S-Parameter Measurements", IEEE Multi-Chip Module Conference MCMC-96, 5-7 February, 1996, Santa Cruz, California, pp.99-104
7. Cascade Microtech, "Microwave Wafer Probe Calibration Constants", Instruction Manual
8. Jyoti P. Mondal, Tzu-Hung Chen, "Propagation constant determination in microwave fixture de-embedding procedure", IEEE Transactions on Microwave Theory and Techniques, Vol. 36, No. 4, April 1988